Taggd
2 months ago
Design for Test Engineer (DFT)
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Company information
- Company
- Taggd
- Location
- India, Karnataka, Bangalore India
- Posted
- 2 months ago
Job description
Hiring for: A leading global IT Services & Consulting firm (Top 5 in India)
Experience: 7 years to 14 years
Location: Bangalore
Work Mode: Hybrid
Notice Period: Immediate to 60Days
Mandatory Skills
- Design for Test
- (DFT)Scan Compression
- Automatic Test Pattern Generation
- (ATPG)Silicon Validation
Roles & Responsibilities
- Develop and implement DFT architecture for complex SoC/ASIC designs.
- Design and integrate scan chains, scan compression, and boundary scan (JTAG) features.
- Generate and validate ATPG patterns for stuck-at, transition, and other fault models.
- Perform DFT verification, coverage analysis, and debug to achieve high manufacturing test coverage.
- Collaborate with RTL, Design, Physical Design, and Verification teams to ensure seamless DFT implementation.
- Support silicon bring-up, silicon validation, and production test activities issues.
- Analyze silicon test failures and work with cross-functional teams to identify and resolve
- Optimize DFT methodologies to improve test quality, reduce test time, and minimize test costs.
- Ensure compliance with industry-standard DFT methodologies and best practices.
- Prepare and maintain DFT documentation, test plans, and implementation reports.
Preferred Qualifications
- Strong understanding of SoC/ASIC design flow.
- Experience with scan insertion, scan compression, ATPG, and fault coverage analysis.
- Hands-on experience in silicon validation and post-silicon debug
- Excellent debugging, analytical, and problem-solving skills.
- Strong communication and collaboration abilities.
Interested candidates, please share your updated resume to [email protected]
Required skills
- debugging
- analytical skills
- problem-solving skills
- asic
- verification
- soc
- test coverage
- physical design
- jtag
- dft
- rtl
- atpg
- boundary scan
- production test
- design for test
- scan compression
- automatic test pattern generation
- silicon validation
- scan chains
- fault models
- dft verification
- silicon bring-up
- fault coverage analysis
- post-silicon debug
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